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VLSI Test Principles and Architectures: Design for Testability by Wang, Wu, and Wen. Essential Algorithms : Study the D-Algorithm for pattern generation. Emerging Trends : Look into IDDQ Testing (measuring current leakage) and Delay Testing (finding chips that run too slow). To help you find exactly what you need, are you: preparing for an exam on DFT? vlsi test principles and architectures pdf

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Detailed explanations of Scan Design and Logic Built-In Self-Test (BIST). vlsi test principles and architectures pdf